Rosa Rodríguez-Montañés, Joan Figueras. Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 490-494, IEEE Computer Society, 1998. [doi]
Abstract is missing.