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Bridging Defects Resistance Measurements in a CMOS Process

Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls. Bridging Defects Resistance Measurements in a CMOS Process. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 892-899, IEEE Computer Society, 1992.

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