Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization

Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips. Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization. In 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016, Orlando, FL, USA, August 16-20, 2016. pages 443-447, IEEE, 2016. [doi]

Authors

Joris Roels

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Jan Aelterman

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Jonas De Vylder

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Hiêp Quang Luong

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Yvan Saeys

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Wilfried Philips

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