Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips. Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization. In 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016, Orlando, FL, USA, August 16-20, 2016. pages 443-447, IEEE, 2016. [doi]
Abstract is missing.