Near-IR response of highly-strained Si photodetector linking first principles and TCAD

Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre. Near-IR response of highly-strained Si photodetector linking first principles and TCAD. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 132-135, IEEE, 2023. [doi]

@inproceedings{RoisinRF23,
  title = {Near-IR response of highly-strained Si photodetector linking first principles and TCAD},
  author = {Nicolas Roisin and Jean-Pierre Raskin and Denis Flandre},
  year = {2023},
  doi = {10.1109/ESSDERC59256.2023.10268568},
  url = {https://doi.org/10.1109/ESSDERC59256.2023.10268568},
  researchr = {https://researchr.org/publication/RoisinRF23},
  cites = {0},
  citedby = {0},
  pages = {132-135},
  booktitle = {53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0423-7},
}