Near-IR response of highly-strained Si photodetector linking first principles and TCAD

Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre. Near-IR response of highly-strained Si photodetector linking first principles and TCAD. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 132-135, IEEE, 2023. [doi]

Abstract

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