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Early Testing of Memory Redundant Row Elements

Luc Romain, Roger Mah, Katarzyna Wojnowska, Albert Au, Lori Schramm. Early Testing of Memory Redundant Row Elements. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 406-409, IEEE, 2025. [doi]

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