Tommaso Romeo, Luigi Pantisano, Eddy Simoen, Raymond Krom, M. Togo, N. Horiguchi, Jérôme Mitard, A. Thean, Guido Groeseneken, Cor Claeys, Felice Crupi. Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 330-333, IEEE, 2012. [doi]
Abstract is missing.