Marly Roncken, Emile H. L. Aarts, Wim F. J. Verhaegh. Optimal Scan for Pipelined Testing: An Asynchronous Foundation. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 215-224, IEEE Computer Society, 1996.
Abstract is missing.