Thermal Resistance Formulation and Analysis of III-V FETs Based on DC Electrical Data

David E. Root, Jianjun Xu, Masaya Iwamoto. Thermal Resistance Formulation and Analysis of III-V FETs Based on DC Electrical Data. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

Abstract is missing.