Felipe Rosa, Fernanda Lima Kastensmidt, Ricardo Reis, Luciano Ost. A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 211-214, IEEE, 2015. [doi]
Abstract is missing.