Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty. Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(11):2502-2512, 2006. [doi]
@article{RosingerAC06,
title = {Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits},
author = {Paul M. Rosinger and Bashir M. Al-Hashimi and Krishnendu Chakrabarty},
year = {2006},
doi = {10.1109/TCAD.2006.873898},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.873898},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/RosingerAC06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {11},
pages = {2502-2512},
}