Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits

Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty. Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(11):2502-2512, 2006. [doi]

Abstract

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