Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding

Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nicolici. Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding. In 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings. pages 474-479, IEEE Computer Society, 2002. [doi]

Abstract

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