Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi. Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. VLSI Syst., 24(8):2735-2744, 2016. [doi]
@article{RossiTYKA16,
title = {Reliable Power Gating With NBTI Aging Benefits},
author = {Daniele Rossi and Vasileios Tenentes and Sheng Yang and S. Saqib Khursheed and Bashir M. Al-Hashimi},
year = {2016},
doi = {10.1109/TVLSI.2016.2519385},
url = {http://dx.doi.org/10.1109/TVLSI.2016.2519385},
researchr = {https://researchr.org/publication/RossiTYKA16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {24},
number = {8},
pages = {2735-2744},
}