Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi. Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. VLSI Syst., 24(8):2735-2744, 2016. [doi]
@article{RossiTYKA16, title = {Reliable Power Gating With NBTI Aging Benefits}, author = {Daniele Rossi and Vasileios Tenentes and Sheng Yang and S. Saqib Khursheed and Bashir M. Al-Hashimi}, year = {2016}, doi = {10.1109/TVLSI.2016.2519385}, url = {http://dx.doi.org/10.1109/TVLSI.2016.2519385}, researchr = {https://researchr.org/publication/RossiTYKA16}, cites = {0}, citedby = {0}, journal = {IEEE Trans. VLSI Syst.}, volume = {24}, number = {8}, pages = {2735-2744}, }