Characterization, design, modeling, and model validation of silicon-wafer M: N balun components under matched and unmatched conditions

Francis M. Rotella, Cristian Cismaru, Yevgeniy Gene Tkachenko, Yuhua Cheng, Peter J. Zampardi. Characterization, design, modeling, and model validation of silicon-wafer M: N balun components under matched and unmatched conditions. J. Solid-State Circuits, 41(5):1201-1209, 2006. [doi]

Abstract

Abstract is missing.