Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

J. Paul Roth, Willard G. Bouricius, Peter R. Schneider. Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits. IEEE Transactions on Computers, 16(5):567-580, 1967. [doi]

Abstract

Abstract is missing.