Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiss, Edgar Rieger, Andreas Mühlberger. High Level Fault Injection for Attack Simulation in Smart Cards. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 118-121, IEEE Computer Society, 2004. [doi]
Abstract is missing.