Thomas Rousselin, G. Hubert, Didier Regis, Marc Gatti, A. Bensoussan. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. Microelectronics Reliability, 76:159-163, 2017. [doi]
@article{RousselinHRGB17,
title = {Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies},
author = {Thomas Rousselin and G. Hubert and Didier Regis and Marc Gatti and A. Bensoussan},
year = {2017},
doi = {10.1016/j.microrel.2017.07.078},
url = {https://doi.org/10.1016/j.microrel.2017.07.078},
researchr = {https://researchr.org/publication/RousselinHRGB17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {159-163},
}