External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies

Thomas Rousselin, G. Hubert, Didier Regis, Marc Gatti, A. Bensoussan. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. Microelectronics Reliability, 76:159-163, 2017. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on