Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies

Thomas Rousselin, G. Hubert, Didier Regis, Marc Gatti, A. Bensoussan. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. Microelectronics Reliability, 76:159-163, 2017. [doi]

Abstract

Abstract is missing.