Rabindra K. Roy. Advantages of High-Level Test Synthesis over Design for Test. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 293, IEEE Computer Society, 1995.
@inproceedings{Roy95:0,
title = {Advantages of High-Level Test Synthesis over Design for Test},
author = {Rabindra K. Roy},
year = {1995},
tags = {testing, design},
researchr = {https://researchr.org/publication/Roy95%3A0},
cites = {0},
citedby = {0},
pages = {293},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}