Automatic test generation for linear digital systems with bi-level search using matrix transform methods

Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d Abreu. Automatic test generation for linear digital systems with bi-level search using matrix transform methods. In ICCAD. pages 224-228, 1992. [doi]

@inproceedings{RoyCPAd92,
  title = {Automatic test generation for linear digital systems with bi-level search using matrix transform methods},
  author = {Rabindra K. Roy and Abhijit Chatterjee and Janak H. Patel and Jacob A. Abraham and Manuel A. d Abreu},
  year = {1992},
  doi = {10.1145/304032.304096},
  url = {http://doi.acm.org/10.1145/304032.304096},
  tags = {testing, search},
  researchr = {https://researchr.org/publication/RoyCPAd92},
  cites = {0},
  citedby = {0},
  pages = {224-228},
  booktitle = {ICCAD},
}