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Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal. Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. In 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, VLSID 2021, Guwahati, India, February 20-24, 2021. pages 316-321, IEEE, 2021. [doi]

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