Rabindra K. Roy, Thomas M. Niermann, Janak H. Patel, Jacob A. Abraham, Resve A. Saleh. Compaction of ATPG-generated test sequences for sequential circuits. In 1988 IEEE International Conference on Computer-Aided Design, ICCAD 1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical Papers. pages 382-385, IEEE, 1988. [doi]
Abstract is missing.