Surajit Kumar Roy, Dona Roy, Chandan Giri, Hafizur Rahaman. Post-bond Stack Testing for 3D Stacked IC. In Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay, editors, Progress in VLSI Design and Test - 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings. Volume 7373 of Lecture Notes in Computer Science, pages 59-68, Springer, 2012. [doi]
Abstract is missing.