Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal. Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electronic Testing, 36(1):123-133, 2020. [doi]
@article{RoySMA20,
title = {Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures},
author = {Soham Roy and Brandon Stiene and Spencer K. Millican and Vishwani D. Agrawal},
year = {2020},
doi = {10.1007/s10836-020-05859-4},
url = {https://doi.org/10.1007/s10836-020-05859-4},
researchr = {https://researchr.org/publication/RoySMA20},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {1},
pages = {123-133},
}