Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures

Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal. Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electronic Testing, 36(1):123-133, 2020. [doi]

Abstract

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