Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, Debesh K. Das. Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 671-676, IEEE Computer Society, 2002. [doi]
Abstract is missing.