Côme Rozon, Dhamin Al-Khalili, Saman Adham, Douglas Racz. Comparing defect coverage for current-mode logic and CMOS VLSI cells. In Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000. pages 429-432, IEEE, 2000. [doi]
@inproceedings{RozonAAR00,
title = {Comparing defect coverage for current-mode logic and CMOS VLSI cells},
author = {Côme Rozon and Dhamin Al-Khalili and Saman Adham and Douglas Racz},
year = {2000},
doi = {10.1109/ICECS.2000.911572},
url = {https://doi.org/10.1109/ICECS.2000.911572},
researchr = {https://researchr.org/publication/RozonAAR00},
cites = {0},
citedby = {0},
pages = {429-432},
booktitle = {Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000},
publisher = {IEEE},
isbn = {0-7803-6542-9},
}