Côme Rozon, Dhamin Al-Khalili, Saman Adham, Douglas Racz. Comparing defect coverage for current-mode logic and CMOS VLSI cells. In Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000. pages 429-432, IEEE, 2000. [doi]
Abstract is missing.