Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches - researchr publication authors

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Tong Ru, Hao Li, Yihui Li, Jianwen Wu, Chao Liu, Ruiqiang Lu, Zhiming Liang, Yongjie Chen, Zheng Wu, Bingfeng Li, Junjie Li. Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2025, Chengdu, China, December 3-7, 2025. pages 936-941, IEEE, 2025. [doi]

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