Tong Ru, Hao Li, Yihui Li, Jianwen Wu, Chao Liu, Ruiqiang Lu, Zhiming Liang, Yongjie Chen, Zheng Wu, Bingfeng Li, Junjie Li. Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2025, Chengdu, China, December 3-7, 2025. pages 936-941, IEEE, 2025. [doi]
@inproceedings{RuLLWLLLCWLL25,
title = {Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches},
author = {Tong Ru and Hao Li and Yihui Li and Jianwen Wu and Chao Liu and Ruiqiang Lu and Zhiming Liang and Yongjie Chen and Zheng Wu and Bingfeng Li and Junjie Li},
year = {2025},
doi = {10.1109/ROBIO66223.2025.11376108},
url = {https://doi.org/10.1109/ROBIO66223.2025.11376108},
researchr = {https://researchr.org/publication/RuLLWLLLCWLL25},
cites = {0},
citedby = {0},
pages = {936-941},
booktitle = {IEEE International Conference on Robotics and Biomimetics, ROBIO 2025, Chengdu, China, December 3-7, 2025},
publisher = {IEEE},
isbn = {979-8-3315-5747-8},
}