An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jinyu Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana. An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE T. Instrumentation and Measurement, 61(2):456-461, 2012. [doi]

This author has not been identified. Look up 'Jinyu Ruan' in GoogleThis author has not been identified. Look up 'Nicolas Monnereau' in GoogleThis author has not been identified. Look up 'David Trémouilles' in GoogleThis author has not been identified. Look up 'Nicolas Mauran' in GoogleThis author has not been identified. Look up 'Fabio Coccetti' in GoogleThis author has not been identified. Look up 'Nicolas Nolhier' in GoogleThis author has not been identified. Look up 'Robert Plana' in Google

runs on WebDSL