Jinyu Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana. An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE T. Instrumentation and Measurement, 61(2):456-461, 2012. [doi]
@article{RuanMTMCNP12,
title = {An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices},
author = {Jinyu Ruan and Nicolas Monnereau and David Trémouilles and Nicolas Mauran and Fabio Coccetti and Nicolas Nolhier and Robert Plana},
year = {2012},
doi = {10.1109/TIM.2011.2161937},
url = {http://dx.doi.org/10.1109/TIM.2011.2161937},
researchr = {https://researchr.org/publication/RuanMTMCNP12},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {61},
number = {2},
pages = {456-461},
}