A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF - researchr publication authors

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F. J. Rubio-Barbero, Eros Camacho-Ruiz, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001. A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF. In 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2023, Funchal, Portugal, July 3-5, 2023. pages 1-4, IEEE, 2023. [doi]

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