A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF

F. J. Rubio-Barbero, Eros Camacho-Ruiz, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001. A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF. In 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2023, Funchal, Portugal, July 3-5, 2023. pages 1-4, IEEE, 2023. [doi]

@inproceedings{RubioBarberoCCRF23,
  title = {A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF},
  author = {F. J. Rubio-Barbero and Eros Camacho-Ruiz and Rafael Castro-López and Elisenda Roca and Francisco V. Fernández 0001},
  year = {2023},
  doi = {10.1109/SMACD58065.2023.10192247},
  url = {https://doi.org/10.1109/SMACD58065.2023.10192247},
  researchr = {https://researchr.org/publication/RubioBarberoCCRF23},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2023, Funchal, Portugal, July 3-5, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-3265-0},
}