Franz X. Ruckerbauer, Georg Georgakos. Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 203-204, IEEE Computer Society, 2007. [doi]
Abstract is missing.