Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM - researchr publication authors

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Markus Rudack, Dirk Niggemeyer. Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 31-39, IEEE Computer Society, 1999. [doi]

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