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Diagnostic Fault Simulation of Sequential Circuits

Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel. Diagnostic Fault Simulation of Sequential Circuits. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 178-186, IEEE Computer Society, 1992.

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