Modeling and Identification of Inter-Stage Couplings and Disturbances in a High-Precision Nanopositioning and Nanomeasuring Machine

Josias Rühle, Oliver Sawodny. Modeling and Identification of Inter-Stage Couplings and Disturbances in a High-Precision Nanopositioning and Nanomeasuring Machine. In 18th IEEE International Conference on Advanced Motion Control, AMC 2024, Kyoto, Japan, February 28 - March 1, 2024. pages 1-6, IEEE, 2024. [doi]

Abstract

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