Claudia Rusu, A. Bougerol, Lorena Anghel, C. Weulersse, N. Buard, S. Benhammadi, N. Renaud, G. Hubert, F. Wrobel, T. Carriere, R. Gaillard. Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 137-145, IEEE Computer Society, 2007. [doi]
Abstract is missing.