Anna R. Ruuskanen, Aku Seppänen, Stephen Duncan, Erkki Somersalo, Jari P. Kaipio. Using tomographic measurements in process control. In 45th IEEE Conference on Decision and Control, CDC 2006, San Diego, CA, USA, 13-15 December, 2006. pages 4696-4701, IEEE, 2004. [doi]
Abstract is missing.