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Process defect trends and strategic test gaps

Paul G. Ryan, Irfan Aziz, William B. Howell, Teresa K. Janczak, Davia J. Lu. Process defect trends and strategic test gaps. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]

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Paul G. Ryan

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Irfan Aziz

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William B. Howell

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Teresa K. Janczak

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Davia J. Lu

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