Paul G. Ryan, Irfan Aziz, William B. Howell, Teresa K. Janczak, Davia J. Lu. Process defect trends and strategic test gaps. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
No references recorded for this publication.
No citations of this publication recorded.