Paul G. Ryan, Irfan Aziz, William B. Howell, Teresa K. Janczak, Davia J. Lu. Process defect trends and strategic test gaps. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
@inproceedings{RyanAHJL14,
title = {Process defect trends and strategic test gaps},
author = {Paul G. Ryan and Irfan Aziz and William B. Howell and Teresa K. Janczak and Davia J. Lu},
year = {2014},
doi = {10.1109/TEST.2014.7035276},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035276},
researchr = {https://researchr.org/publication/RyanAHJL14},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}