A high resolution and high linearity 45nm CMOS fully digital voltage sensor for low power applications

Myunghwan Ryu, Youngmin Kim. A high resolution and high linearity 45nm CMOS fully digital voltage sensor for low power applications. IEICE Electronic Express, 10(13):20130400, 2013. [doi]

Authors

Myunghwan Ryu

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Youngmin Kim

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