Myunghwan Ryu, Youngmin Kim. A high resolution and high linearity 45nm CMOS fully digital voltage sensor for low power applications. IEICE Electronic Express, 10(13):20130400, 2013. [doi]
@article{RyuK13a,
title = {A high resolution and high linearity 45nm CMOS fully digital voltage sensor for low power applications},
author = {Myunghwan Ryu and Youngmin Kim},
year = {2013},
doi = {10.1587/elex.10.20130400},
url = {http://dx.doi.org/10.1587/elex.10.20130400},
researchr = {https://researchr.org/publication/RyuK13a},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {10},
number = {13},
pages = {20130400},
}