Haripriya R. S, Naveen Kollepara, Jaynarayan T. Tudu. SiFFS: A Scalable in-Fault Functional Simulation Framework for Fault Criticality Analysis. In IEEE European Test Symposium, ETS 2025, Tallinn, Estonia, May 26-30, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.