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LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation

Seongmoon Wang, Sandeep K. Gupta. LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 85-94, IEEE Computer Society, 1999.

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